Table of research methods
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Main classification
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Sub-classification
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Examples of keywords
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| X-ray diffraction | Single-crystal diffraction | Multiwavelength anomalous dispersion method, X-ray crystallography |
| Powder diffraction | Rietveld analysis, Maximum entropy method, Energy dispersion method | |
| Surface/interface structure diffraction | CTR, Small-angle diffraction method, Surface and interface diffraction, In situ X-ray diffraction | |
| Standing wave method | Structural analysis of surface-adsorbed atoms, Interfacial structural analysis | |
| Reflectivity method | Anomalous dispersion method, Electron density analysis in depth direction | |
| Distortion analysis | Microbeam X-ray diffraction | |
| Others | Inverse lattice imaging method, Time-resolved diffraction method, Domain size analysis | |
| X-ray scattering | Small-angle scattering | Small-angle scattering, GISAXA, SAXS/WAXS simultaneous measurement |
| Medium-angle scattering | Amorphous/liquid scattering | |
| Diffuse scattering | ||
| Others | Speckle | |
| Magnetic scattering | Magnetic scattering | Magnetic diffraction, Magnetic resonant scattering |
| ATS scattering | ||
| Others | ||
| Inelastic scattering | Inelastic scattering | High-resolution inelastic scattering |
| Nuclear resonant | Nuclear excitation | |
| Compton scattering | Compton magnetic scattering Resonant inelastic X-ray scattering, Lifetime free XAFS Soft X-ray spectroscopy | |
| Emission spectroscopy | ||
| Others | ||
| X-ray/ soft X-ray absorption spectroscopy |
XAFS | XANES, DAFS, Mapping |
| X-ray fluorescence analysis | Element/mass analysis, Chemical state analysis, Mapping | |
| Magnetic absorption | Magnetic circular dichroism, Mapping | |
| Soft X-ray spectroscopy | ||
| Infrared spectroscopy | Infrared microscopes, Infrared microspectroscopy, Infrared spectroscopy under low temperature/high pressure/high magnetic field | |
| Others | ||
| Photoelectron spectroscopy | Photoelectron spectroscopy | Hard X-ray photoelectron spectroscopy, Resonant photoelectron spectroscopy, Soft X-ray angle-resolved photoelectron spectroscopy, Soft X-ray photoelectron spectroscopy, Real-time photoelectron spectroscopy |
| Photoelectron emission microscopy (PEEM) | XAFS of selected local domain, Photoelectron spectroscopy of local domain, Magnetic state imaging, Electronic state imaging |
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| Photoelectron diffraction/photoelectron holography | 2D photoelectron spectroscopy, Auger electron diffraction, Stereo atomic microscopes | |
| Coincidence spectroscopy | Momentum imaging spectroscopy for coincidence counting of electrons/ions, TOF mass analysis, Coincidence counting of photoelectrons and photoions |
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| Others | ||
| X-ray Imaging | X-ray topography | White light, Plane waves, Microbeam topography |
| X-ray CT | Micro-CT, Phase CT, Refraction contrast CT | |
| X-ray holography | Fourier transform holography, Holography, Microscopes | |
| X-ray microscopy | Phase difference microscopes, Spectroscopic microscopy, Scanning microscopes | |
| Others | ||
| X-ray optics | Diffraction/scattering/absorption | Measurement methods, Basic theory |
| Resonant scattering | Principles of anomalous scattering and diffraction | |
| Phase optics | Interferometers, Coherence | |
| Quantum optics | Nonlinear optics, Intensity fluctuation | |
| Others | ||
| Extreme environment experiments | High temperatures, high pressures, strong magnetic fields | Large-volume and high-pressure pressing, Energy dispersion X-ray diffraction, X-ray radiograph |
| Others | ||
| Others | Others |