SPring-8 / SACLA Research Report

ISSN 2187-6886

早期公開 最新版

SPring-8 Section A: Scientific Research Report

2011B1464 / BL40B2
Effect of Film Thickness on Induction Time of Isothermal Crystallization from the Melt of Poly(3-hydroxybutyrate) Investigated by Time-resolved Grazing-incidence X-ray Scattering Measurements Using Synchrotron Radiation

Sono Sasakia,b, Akiyoshi Yasudaa, Hiroyasu Masunagac,

Noboru Ohtac, Shinichi Sakuraia, Masaki Takatac,d

aKyoto Institute of Technology, bRIKEN SPring-8 Center,

cJapan Synchrotron Radiation Research Institute, dTohoku University


Isothermal crystallization behaviors from the melt have been investigated for poly (3-hydroxybutyrate) (P3HB) thin films by time-resolved measurements of grazing-incidence X-ray scattering using synchrotron radiation. P3HB films with thicknesses of ca. 25 nm ~ 3.2 μm prepared on silicon substrates were cooled rapidly from the melt to a crystallization temperature, Tc, of 373 K by using a temperature-jump (T-jump) apparatus. Isothermal crystallization behaviors of P3HB in thin films were traced by simultaneous measurements of grazing-incidence wide-angle X-ray scattering (GIWAXS) and small-angle X-ray scattering (GISAXS). It was experimentally found for the first time that the induction time of crystallization became longer with reducing the film thickness. This indicated that the chain mobility necessary for nucleation at 373 K was reduced in thin films. It was also indicated that lamellar crystals having the edge-on type orientation to the substrate surface were preferentially formed at the beginning of crystallization. Those lamellae in the thin films might be stacked one another with amorphous chains in a disordered manner.

キーワード: crystallization kinetics, poly(3-hydroxybuthyrate) thin film, grazing-incidence small-angle and wide-angle X-ray scattering measurement using synchrotron radiation, induction time of crystallization, film-thickness effect

2011B3604 / BL14B1
Structural Study of Water under Pressure at High Temperature

片山 芳則aヤガファロフ オスカーb, 齋藤 寛之a

Yoshinori Katayamaa, Oscar Yagafarovb, Hiroyuki Saitoha

a(国研)量子科学技術研究開発機構, bロシア科学アカデミー高圧物理学研究所

a National Institutes for Quantum and Radiological Science and Technology,

b Institute for High Pressure Physics, Russian Academy of Sciences


 水の構造の温度変化を調べるため、高温高圧下での水のX線回折実験を行った。温度 1273 K で、常温常圧の水とほぼ同じとなる条件での測定に成功した。温度 1273 K での水の構造は、常温常圧とは大きく異なるが、673 K での構造からの変化は小さいことが明らかになった。

Keywords: Water、Liquid、Structure

SPring-8 Section B: Industrial Application Report

2016B5311, 2017A5311, 2017B5311 / BL16B2
Analysis on Internal Residual Stress of Thermal Barrier Coating using High Energy X-Ray

根上 将大a, 日比野 真也a, 水間 秀一a, 黒松 博之b, 尾角 英毅a

Masahiro Negamia, Shinya Hibinoa, Shuichi Mizumaa, Hiroyuki Kuromatsub, Hideki Okadoa

a川崎重工業(株), b川重テクノロジー(株)

aKawasaki Heavy Industries, Ltd., bKawasaki Technology Co., Ltd.



キーワード: X線回折、応力測定、遮熱コーティング