Title/Place of Publication
Publication ID
9853
Date Created
2007.01.30 10:57
DOI
10.1143/JJAP.45.6795
Open Access URL
English Title
White X-ray Topography of Lattice Undulation in Bonded Silicon-on-Insulator Wafers
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Japanese Journal of Applied Physics
Vol.
45
No.
9A
Year of Publication
2006
Page
6795-6799
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0006085
Fukuda
Kazunori
University of Hyogo
Coauthor 1
0006087
Yoshida
Takayoshi
Osaka University
Coauthor 2
0001281
Shimura
Takayoshi
Osaka University
Coauthor 3
Yasutake
Kiyoshi
Osaka University
Coauthor 4
Umeno
Masataka
Osaka University
Coauthor 5
0001768
Iida
Satoshi
Toyama University
Related Proposal Information
Proposal Number
2001B0117
Beamline
BL28B2
Project Leader
志村 考功