Title/Place of Publication
Publication ID
9708
Date Created
2007.01.30 10:57
DOI
10.1063/1.2336626
Open Access URL
English Title
Thickness Dependence of Dielectric Properties in Bismuth Layer-Structured Dielectrics
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Applied Physics Letters
Vol.
89
No.
8
Year of Publication
2006
Page
082901
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
Takahashi
Kenji
Tokyo Institute of Technology
Coauthor 1
Suzuki
Muneyasu
Tokyo Institute of Technology
Coauthor 2
Kojima
Takashi
Tokyo Institute of Technology
Coauthor 3
Watanabe
Takayuki
Tokyo Institute of Technology
Coauthor 4
Sakashita
Yukio
TDK Corporation
Coauthor 5
Kato
Kazumi
National Institute of Advanced Industrial Science and Technology
Coauthor 6
0003369
Sakata
Osami
SPring-8/JASRI
Coauthor 7
0003162
Sumitani
Kazushi
SPring-8/JASRI
Coauthor 8
0013617
Funakubo
Hiroshi
Tokyo Institute of Technology
Related Proposal Information
Proposal Number
2005A0101
Beamline
BL13XU
Project Leader
坂田 修身
Proposal Number
2005B0189
Beamline
BL13XU
Project Leader
舟窪 浩
Proposal Number
2005B0435
Beamline
BL13XU
Project Leader
坂田 修身
Proposal Number
J05A0510
Beamline
BL13XU
Project Leader
坂田 修身