Title/Place of Publication
967
2007.01.30 10:55
Epitaxially Ordered Structure in the Buried Oxide Layer of SIMOX Wafers
Refereed Journals, Doctoral Thesis, Refereed Proceedings
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface-4, 2000: Proceedings of the Fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface
2000-2 2000 241-249
Fouth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface 4
2000.05.15-05.18 Tronto, Canada
Authors
 
First Author 0001281 Shimura Takayoshi Osaka University
Coauthor 1 0004419 Hosoi Takuji Osaka University
Coauthor 2 0005066 Umeno Masataka Osaka University
Related Proposal Information
1999A0024 BL09XU 志村 考功