Title/Place of Publication
Publication ID
960
Date Created
2007.01.30 10:55
DOI
10.1016/S0022-0248(99)00655-7
Open Access URL
English Title
Characterization of SOI Wafers by X-Ray CTR Scattering
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Crystal Growth
Vol.
210
No.
1-3
Year of Publication
2000
Page
98-101
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001281
Shimura
Takayoshi
Osaka University
Coauthor 1
0004419
Hosoi
Takuji
Osaka University
Coauthor 2
0005066
Umeno
Masataka
Osaka University
Related Proposal Information
Proposal Number
1999A0024
Beamline
BL09XU
Project Leader
志村 考功