Title/Place of Publication
960
2007.01.30 10:55
10.1016/S0022-0248(99)00655-7
Characterization of SOI Wafers by X-Ray CTR Scattering
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Journal of Crystal Growth
210 1-3 2000 98-101
Authors
 
First Author 0001281 Shimura Takayoshi Osaka University
Coauthor 1 0004419 Hosoi Takuji Osaka University
Coauthor 2 0005066 Umeno Masataka Osaka University
Related Proposal Information
1999A0024 BL09XU 志村 考功