Title/Place of Publication
Publication ID
8104
Date Created
2007.01.30 10:56
DOI
10.1143/JJAP.44.4211
Open Access URL
English Title
New Topographic Method of Detecting Microdefects Using Weak-Beam Topography with White X-Rays
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Japanese Journal of Applied Physics
Vol.
44
No.
6A
Year of Publication
2005
Page
4211-4212
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001794
Kajiwara
Kentarou
SPring-8/JASRI
Coauthor 1
0004124
Kimura
Shigeru
SPring-8/JASRI
Coauthor 2
0001769
Chikaura
Yoshinori
Kyushu Institute of Technology
Related Proposal Information
Proposal Number
2000A0102
Beamline
BL28B2
Project Leader
木村 滋
Proposal Number
2003A0622
Beamline
BL28B2
Project Leader
梶原 堅太郎
Proposal Number
2003B0747
Beamline
BL28B2
Project Leader
梶原 堅太郎