Title/Place of Publication
8067
2007.01.30 10:56
10.1016/j.elspec.2005.03.004
X-ray Absorption and Emission Spectroscopy at the Hf-L1 Edge of Hafnium-(Silicon)-Oxide Ultra-Thin Film
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Journal of Electron Spectroscopy and Related Phenomena
148 2 2005 75-79
Authors
 
First Author 0004121 Uehara Yasushi Mitsubishi Electric Corporation
Coauthor 1 0005022 Kawase Kazumasa Mitsubishi Electric Corporation
Coauthor 2 Tsuchimoto Jun'ichi Renesas Corporation
Coauthor 3 Shibano Teruo Mitsubishi Electric Corporation
Related Proposal Information
C03B3014 BL16XU 上原 康