Title/Place of Publication
7655
2007.01.30 10:56
10.1016/j.apsusc.2004.10.145
In situ X-ray Diffraction Study of Crystallization Process of GeSbTe Thin Films during Heat Treatment
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Applied Surface Science
244 1-4 2005 281-284
Authors
 
First Author 0005046 Kato Naohiko Toyota Central R&D Laboratories, Inc.
Coauthor 1 0004119 Konomi Ichiro Toyota Central R&D Laboratories, Inc.
Coauthor 2 0004989 Seno Yoshiki Toyota Central R&D Laboratories, Inc.
Coauthor 3 Motohiro Tomoyoshi Toyota Central R&D Laboratories, Inc.
Related Proposal Information
C00A0326 BL16XU 妹尾 与志木