Title/Place of Publication
Publication ID
7619
Date Created
2007.01.30 10:56
DOI
10.1088/0022-3727/38/10A/004
Open Access URL
English Title
Three-Dimensional Structure of Dislocations in Silicon Determined by Synchrotron White X-ray Topography Combined with a Topo-Tomographic Technique
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Physics D: Applied Physics
Vol.
38
No.
10
Year of Publication
2005
Page
A17-A22
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0003776
Kawado
Seiji
Rigaku Corporation
Coauthor 1
0007513
Taishi
Toshinori
Shinshu University
Coauthor 2
0001768
Iida
Satoshi
Toyama University
Coauthor 3
0001776
Suzuki
Yoshifumi
Kyushu Institute of Technology
Coauthor 4
0001769
Chikaura
Yoshinori
Kyushu Institute of Technology
Coauthor 5
0001794
Kajiwara
Kentarou
SPring-8/JASRI
Related Proposal Information
Proposal Number
2002B0717
Beamline
BL20B2
Project Leader
太子 敏則
Proposal Number
2004A0099
Beamline
BL28B2
Project Leader
川戸 清爾