|
7500 |
|
2007.01.30 10:56 |
|
10.1016/j.tsf.2004.09.040 |
|
|
|
Comparison of Ordered Structure in Buried Oxide Layers in High-Dose, Low-Dose, and Internal-Thermal-Oxidation Separation-by-Implanted-Oxygen Wafers |
|
Refereed Journals, Doctoral Thesis, Refereed Proceedings |
|
Thin Solid Films
476
1
2005
125-129
|
|
|
|
|
|
|