Title/Place of Publication
Publication ID
7368
Date Created
2007.01.30 10:56
DOI
10.1063/1.1864245
Open Access URL
English Title
X-ray Diffraction Measurements of Internal Strain in Si Nanowires Fabricated using a Self-Limiting Oxidation Process
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Applied Physics Letters
Vol.
86
No.
7
Year of Publication
2005
Page
071903
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001281
Shimura
Takayoshi
Osaka University
Coauthor 1
Yasutake
Kiyoshi
Osaka University
Coauthor 2
0005066
Umeno
Masataka
Fukui University of Technology
Coauthor 3
Nagase
Masao
NTT Basic Research Laboratories
Related Proposal Information
Proposal Number
2000B0068
Beamline
BL09XU
Project Leader
志村 考功