Title/Place of Publication
Publication ID
704
Date Created
2007.01.30 10:55
DOI
10.1063/1.1290048
Open Access URL
English Title
High-Resolution Microbeam X-Ray Diffractometry Applied to InGaAsP/InP Layers Grown by Narrow-Stripe Selective Metal-Organic Vapor Phase Epitaxy
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Applied Physics Letters
Vol.
77
No.
9
Year of Publication
2000
Page
1286-1288
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0004124
Kimura
Shigeru
NEC Corporation
Coauthor 1
0001267
Kimura
Hidekazu
NEC Corporation
Coauthor 2
0003403
Kobayashi
Kenji
NEC Corporation
Coauthor 3
0004654
Oohira
Tomoaki
NEC Corporation
Coauthor 4
0004081
Izumi
Koichi
NEC Corporation
Coauthor 5
Sakata
Yasutaka
NEC Corporation
Coauthor 6
0001231
Tsusaka
Yoshiyuki
Himeji Institute of Technology
Coauthor 7
0001341
Yokoyama
Kazushi
Himeji Institute of Technology
Coauthor 8
0003437
Takeda
Shingo
Himeji Institute of Technology
Coauthor 9
0004194
Urakawa
Masafumi
Himeji Institute of Technology
Coauthor 10
0001230
Kagoshima
Yasushi
Himeji Institute of Technology
Coauthor 11
0001232
Matsui
Junji
Himeji Institute of Technology
Related Proposal Information
Proposal Number
C99B0545
Beamline
BL24XU
Project Leader
木村 滋