Title/Place of Publication
6861
2007.01.30 10:56
10.1016/j.sab.2004.03.022
Submicron-Resolved X-ray Topography using Asymmetric-Reflection Magnifiers
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Spectrochimica Acta Part B
59 10-11 2004 1549-1555
Authors
 
First Author 0006449 Tanuma Ryohei Fuji Electric Advanced Technology Co., Ltd.
Coauthor 1 0004130 Ohsawa Michio Fuji Electric Advanced Technology Co., Ltd.
Related Proposal Information
C02B3009 BL16XU 田沼 良平
C02A3000 BL16XU 大沢 通夫