Title/Place of Publication
Publication ID
6404
Date Created
2007.01.30 10:56
DOI
10.1107/S0909049504012609
Open Access URL
English Title
Determination of the Three-Dimensional Structure of Dislocations in Silicon by Synchrotron White X-ray Topography Combined with a Topo-Tomographic Technique
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Synchrotron Radiation
Vol.
11
No.
4
Year of Publication
2004
Page
304-308
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0003776
Kawado
Seiji
Rigaku Corporation
Coauthor 1
0007513
Taishi
Toshinori
Shinshu University
Coauthor 2
0001768
Iida
Satoshi
Toyama University
Coauthor 3
0001776
Suzuki
Yoshifumi
Kyushu Institute of Technology
Coauthor 4
0001769
Chikaura
Yoshinori
Kyushu Institute of Technology
Coauthor 5
0001794
Kajiwara
Kentarou
SPring-8/JASRI
Related Proposal Information
Proposal Number
2003A0129
Beamline
BL28B2
Project Leader
川戸 清爾