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6272 |
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2007.01.30 10:56 |
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10.1299/jsmea.47.312 |
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https://doi.org/10.1299/jsmea.47.312 |
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Evaluation of Internal Stresses in Single-, Double- and Multi-Layered TiN and TiAlN Thin Films by Synchrotron Radiation |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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JSME International Journal Series A
47
3
2004
312-317
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