Title/Place of Publication
5999
2007.01.30 10:56
10.1143/JJAP.43.L421
High-Spatial-Resolution Phase Measurement by Micro-Interferometry Using a Hard X-Ray Imaging Microscope
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Japanese Journal of Applied Physics
43 3B 2004 L421-L423
Authors
 
First Author 0007226 Koyama Takahisa Himeji Institute of Technology
Coauthor 1 0001230 Kagoshima Yasushi Himeji Institute of Technology
Coauthor 2 0007197 Wada Izumi Himeji Institute of Technology
Coauthor 3 0008619 Saikubo Akihiko Himeji Institute of Technology
Coauthor 4 0008617 Shimose Kenichi Himeji Institute of Technology
Coauthor 5 0008616 Hayashi Kenji Himeji Institute of Technology
Coauthor 6 0001231 Tsusaka Yoshiyuki Himeji Institute of Technology
Coauthor 7 0001232 Matsui Junji Himeji Institute of Technology
Related Proposal Information
C03A5042 BL24XU 篭島 靖