Title/Place of Publication
Publication ID
5096
Date Created
2007.01.30 10:56
DOI
10.1016/S0022-0248(01)01931-5
Open Access URL
English Title
Microscopic Strain Analysis of Semiconductor Crystals Using a Synchrotron X-Ray Microbeam
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Crystal Growth
Vol.
237-239
No.
Year of Publication
2002
Page
317-323
Place of Publication (Oral, Poster)
Conference Title
13th International Conference on Crystal Growth (ICCG-13)
Date
2001.07.31-08.04
Venue
Kyoto, Japan
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001232
Matsui
Junji
Himeji Institute of Technology
Coauthor 1
0001231
Tsusaka
Yoshiyuki
Himeji Institute of Technology
Coauthor 2
0001341
Yokoyama
Kazushi
Himeji Institute of Technology
Coauthor 3
0003437
Takeda
Shingo
Himeji Institute of Technology
Coauthor 4
0004194
Urakawa
Masafumi
Himeji Institute of Technology
Coauthor 5
0001230
Kagoshima
Yasushi
Himeji Institute of Technology
Coauthor 6
0004124
Kimura
Shigeru
NEC Corporation
Related Proposal Information
Proposal Number
C00B5041
Beamline
BL24XU
Project Leader
松井 純爾
Proposal Number
C99B0541
Beamline
BL24XU
Project Leader
松井 純爾