タイトル・発表先
4937
2007.01.30 10:56
10.1016/S0921-4526(03)00278-3
Structural Characterization of InGaN Thin Films and Multiple Quantum Wells: an Approah of Combining Various X-Ray Scatterng Methods
原著論文/博士論文/査読付プロシーディングス
Physica B
336 1-2 2003 109-117
著者情報
 
主著者 0007099 Lee Hyun-Hwi Kwangju Institute of Science and Technology
共著者 1 0007100 Jang Hyeon-Woo Kwangju Institute of Science and Technology
共著者 2 0008312 Kim Do-Hyung Kwangju Institute of Science and Technology
共著者 3 0004652 Noh Do Young Kwangju Institute of Science and Technology
共著者 4 0007678 Yi Min-Su Sangju National University
共著者 5 0004865 Tang Mao-Tsu Synchrotron Radiation Research Center
共著者 6 0004868 Liang Keng S. Synchrotron Radiation Research Center
関連課題情報
C02A1006 BL12B2 Noh DoYoung