Title/Place of Publication
Publication ID
4766
Date Created
2007.01.30 10:56
DOI
10.1088/0953-8984/14/44/330
Open Access URL
English Title
Charge Density Analysis of SiO
2
under Pressures over 50GPa Using a New Diamond Anvil Cell for Single-Crystal Structure Analysis
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Physics: Condensed Matter
Vol.
14
No.
44
Year of Publication
2002
Page
10545-10551
Place of Publication (Oral, Poster)
Conference Title
International Conference on High Pressure Science and Technology (AIRAPT)
Date
2001.07.23−07.27
Venue
Beijing, China
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0003066
Yamanaka
Takamitsu
Osaka University
Coauthor 1
0004351
Fukuda
Tomoo
Osaka University
Coauthor 2
0005508
Komatsu
Yutaka
Osaka University
Coauthor 3
Sumiya
Hitoshi
Sumitomo Electric Industries, Ltd
Related Proposal Information
Proposal Number
2002B0013
Beamline
BL02B1
Project Leader
山中 高光