Title/Place of Publication
38954
2019.11.10 20:53
10.1107/S1600577519012827
Local Atomic Structure Analysis of GaN Surfaces via X-ray Absorption Spectroscopy by Detecting Auger Electrons with Low Energies
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Journal of Synchrotron Radiation
26 6 2019 1951-1955
[A80] Industrial Applications
[M40] X-ray/Soft X-ray Absorption Spectroscopy
Authors
 
First Author 0006869 Isomura Noritake Toyota Central Research and Development Laboratories, Inc.
Coauthor 1 0024878 Kikuta Daigo Toyota Central Research and Development Laboratories, Inc.
Coauthor 2 0018550 Takahashi Naoko Toyota Central Research and Development Laboratories, Inc.
Coauthor 3 0017224 Kosaka Satoru Toyota Central Research and Development Laboratories, Inc.
Coauthor 4 0014336 Kataoka Keita Toyota Central Research and Development Laboratories, Inc.
Related Proposal Information
2018B5071 BL16XU 高橋 直子
2019A5071 BL16XU 高橋 直子