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38954 |
|
2019.11.10 20:53 |
|
10.1107/S1600577519012827 |
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|
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Local Atomic Structure Analysis of GaN Surfaces via X-ray Absorption Spectroscopy by Detecting Auger Electrons with Low Energies |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
|
Journal of Synchrotron Radiation
26
6
2019
1951-1955
|
|
|
|
[A80] Industrial Applications |
|
[M40] X-ray/Soft X-ray Absorption Spectroscopy
|