User Information

Title/Place of Publication
Publication ID	38691
Date Created	2019.09.17 12:29
DOI
Open Access URL
English Title	Synchrotron X-ray Photoelectron Spectroscopy on Interface State Densities of CVD-Grown SiO₂/4H-SiC Structures Treated by Post-Deposition Treatments
Type of Publication	Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)	Journal Title Extended Abstract (Proceedings) of 2019 International Conference on Solid State Devices and Materials (SSDM) Vol. No. Year of Publication 2019 Page 741-742
Place of Publication (Oral, Poster)	Conference Title 2019 International Conference on Solid State Devices and Materials (SSDM2019) Date 2019.09.02-09.05 Venue Nagoya, Japan
Research Area	[A80] Industrial Applications
Research Method	[M50] Photoelectron Spectroscopy

Authors
	User Card ID No.	Last/Family	First/Given	Affiliation
First Author	0034687	Kiyoi	Akira	Mitsubishi Electric Corporation
Coauthor 1	0018695	Suwa	Tomoyuki	Tohoku University
Coauthor 2	0015560	Teramoto	Akinobu	Tohoku University
Coauthor 3	0005022	Kawase	Kazumasa	Mitsubishi Electric Corporation

Related Proposal Information
Proposal Number 2017B5130 Beamline BL16XU Project Leader 清井明
Proposal Number 2018A5130 Beamline BL16XU Project Leader 清井明
Proposal Number 2018B5130 Beamline BL16XU Project Leader 今澤貴史