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38290 |
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2019.07.31 16:10 |
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10.1016/j.jmmm.2019.165536 |
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|
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Low Write Current and Strong Durability in High-Speed Spintronics Memory (Spin-Hall MRAM and VoCSM) through Development of a Shunt-Free Design Process and W Spin-Hall Electrode |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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Journal of Magnetism and Magnetic Materials
491
2019
165536
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[A80] Industrial Applications |
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[M50] Photoelectron Spectroscopy
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