Title/Place of Publication
38290
2019.07.31 16:10
10.1016/j.jmmm.2019.165536
Low Write Current and Strong Durability in High-Speed Spintronics Memory (Spin-Hall MRAM and VoCSM) through Development of a Shunt-Free Design Process and W Spin-Hall Electrode
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Journal of Magnetism and Magnetic Materials
491 2019 165536
[A80] Industrial Applications
[M50] Photoelectron Spectroscopy
Authors
 
First Author Kato Yushi Toshiba Corporation
Coauthor 1 Yoda Hiroaki Toshiba Corporation
Coauthor 2 0021764 Inokuchi Tomoaki Toshiba Corporation
Coauthor 3 Shimizu Mariko Toshiba Corporation
Coauthor 4 Ohsawa Yuich Toshiba Corporation
Coauthor 5 0042208 Fujii Keiko Toshiba Corporation
Coauthor 6 0004423 Yoshiki Masahiko Toshiba Corporation
Coauthor 7 Oikawa Soichi Toshiba Corporation
Coauthor 8 Shirotori Satoshi Toshiba Corporation
Coauthor 9 Koi Katsuhiko Toshiba Corporation
Coauthor 10 Shimomura Naoharu Toshiba Corporation
Coauthor 11 Altansargai Buyandalai Toshiba Corporation
Coauthor 12 Sugiyama Hideyuki Toshiba Corporation
Coauthor 13 Kurobe Atsushi Toshiba Corporation
Related Proposal Information
2018A5360 BL16B2 藤井 景子
2018B5360 BL16B2 藤井 景子
2018B5060 BL16XU 藤井 景子