User Information

Title/Place of Publication
Publication ID	38074
Date Created	2019.06.06 15:01
DOI	10.7567/1347-4065/ab0f19
Open Access URL	https://doi.org/10.7567/1347-4065/ab0f19
English Title	Evaluation of Dislocations under the Electrodes of GaN pn Diodes by X-ray Topography
Type of Publication	Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)	Journal Title Japanese Journal of Applied Physics Vol. 58 No. 5C Year of Publication 2019 Page SCCD22
Place of Publication (Oral, Poster)	Conference Title Date Venue
Research Area	[A60] Environmental Science
Research Method	[M60] X-ray Imaging

Authors
	User Card ID No.	Last/Family	First/Given	Affiliation
First Author	0037816	Kanechika	Masakazu	Toyota Central Research and Development Laboratories, Inc.
Coauthor 1	0006044	Yamaguchi	Satoshi	Toyota Central Research and Development Laboratories, Inc.
Coauthor 2	0035996	Imanishi	Masayuki	Osaka University
Coauthor 3		Mori	Yusuke	Osaka University

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