Title/Place of Publication
37899
2019.05.08 13:48
10.7567/1347-4065/ab1a53
High-Resolution X-ray Topography of Threading Edge Dislocations in 4H-SiC using a Novel Nuclear Emulsion Film Improved Special Resolution and Sensitivity
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Japanese Journal of Applied Physics
58 6 2019 060901
[A80] Industrial Applications
[M60] X-ray Imaging
Authors
 
First Author 0006044 Yamaguchi Satoshi Toyota Central Research and Development Laboratories, Inc.
Coauthor 1 0017031 Naganawa Naotaka Nagoya University
Coauthor 2 0008169 Nakamura Mituhiro Nagoya University
Related Proposal Information
2011B5370 BL16B2 山口 聡
2012A5370 BL16B2 山口 聡
2013B5370 BL16B2 山口 聡
2014A5370 BL16B2 山口 聡
2014B5371 BL16B2 山口 聡
2015A5371 BL16B2 山口 聡
2015B5370 BL16B2 山口 聡