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37053 |
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2018.10.31 11:00 |
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10.1149/08607.0411ecst |
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High-Sn Concentration MOCVD-Grown Strained GeSn Thin Films Evaluated Using HAXPES and XRD Base on Synchrotron Technique |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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ECS Transactions
86
7
2018
411-418
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[A80] Industrial Applications |
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[M50] Photoelectron Spectroscopy
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