Title/Place of Publication
37053
2018.10.31 11:00
10.1149/08607.0411ecst
High-Sn Concentration MOCVD-Grown Strained GeSn Thin Films Evaluated Using HAXPES and XRD Base on Synchrotron Technique
Refereed Journals, Doctoral Thesis, Refereed Proceedings
ECS Transactions
86 7 2018 411-418
[A80] Industrial Applications
[M50] Photoelectron Spectroscopy
Authors
 
First Author 0019880 Usuda Koji Toshiba Memory Corporation
Coauthor 1 0004423 Yoshiki Masahiko Toshiba Corporation
Coauthor 2 0035178 Suda Kohei Meiji University
Coauthor 3 0015928 Ogura Atsushi Meiji University
Coauthor 4 0035715 Tomita Mitsuhiro Toshiba Memory Corporation
Related Proposal Information
2016A5060 BL16XU 臼田 宏治
2016B5060 BL16XU 臼田 宏治
2017A5060 BL16XU 臼田 宏治
2017B5060 BL16XU 吉木 昌彦