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36072 |
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2018.05.21 16:25 |
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10.3390/cryst7120356 |
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http://www.mdpi.com/2073-4352/7/12/356 |
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Structural Characterization of Perpendicularly Aligned Submicrometer-Thick Synthetic Glycolipid Polycrystalline Films Using Conventional X-ray Diffraction |
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原著論文／博士論文／査読付プロシーディングス |
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Crystals
7
12
2017
356
|
|
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[A30] 物質科学・材料科学 |
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[M10] X線回折
|