|
35576 |
|
2018.03.08 09:35 |
|
10.1384/jsa.24.56 |
|
https://www.jstage.jst.go.jp/article/jsa/24/1/24_56/_article/-char/ja/ |
|
Structural Analysis in the Surface of Nitride Semiconductor by Grazing Incidence X-ray Diffraction |
|
Refereed Journals, Doctoral Thesis, Refereed Proceedings |
|
Journal of Surface Analysis
24
1
2017
55-60
|
|
|
|
[A80] Industrial Applications |
|
[M10] X-ray Diffraction
|