User Information

Title/Place of Publication
Publication ID	35434
Date Created	2018.02.09 13:21
DOI
Open Access URL
English Title	Correlation between Electronic Structure of SiN/AlGaN Interface and Gate Leakage Current
Type of Publication	Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)	Journal Title 電気材料技術雑誌 (Journal of the Society of Electrical Materials Engineering) Vol. 26 No. 1 Year of Publication 2017 Page 5-12
Place of Publication (Oral, Poster)	Conference Title Date Venue
Research Area	[A30] Materials Science and Engineering
Research Method	[M50] Photoelectron Spectroscopy

Authors
	User Card ID No.	Last/Family	First/Given	Affiliation
First Author		Kurahashi	Kenichiro	Mitsubishi Electric Corporation
Coauthor 1	0036659	Tanaka	Masayuki	Mitsubishi Electric Corporation
Coauthor 2	0034687	Kiyoi	Akira	Mitsubishi Electric Corporation
Coauthor 3	0028927	Motoya	Tsukasa	Mitsubishi Electric Corporation
Coauthor 4		Nanjo	Takuma	Mitsubishi Electric Corporation
Coauthor 5		Yagyu	Eiji	Mitsubishi Electric Corporation

Related Proposal Information
Proposal Number 2014B5130 Beamline BL16XU Project Leader 清井明
Proposal Number 2015A5130 Beamline BL16XU Project Leader 清井明
Proposal Number 2015B5130 Beamline BL16XU Project Leader 清井明