Title/Place of Publication
Publication ID
35331
Date Created
2018.01.30 11:43
DOI
10.7567/APEX.11.031001
Open Access URL
English Title
Synchrotron Radiation Microbeam X-ray Diffraction for Nondestructive Assessments of Local Structural Properties of Faceted InGaN/GaN Quantum Wells
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Applied Physics Express
Vol.
11
No.
3
Year of Publication
2018
Page
031001
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
[A80] Industrial Applications
Research Method
[M10] X-ray Diffraction
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0019656
Sakaki
Atsushi
Nichia Corporation
Coauthor 1
Funato
Mitsuru
Kyoto University
Coauthor 2
0003394
Kawamura
Tomoaki
Nichia Corporation
Coauthor 3
0020266
Araki
Jun
Nichia Corporation
Coauthor 4
Kawakami
Yoichi
Kyoto University
Related Proposal Information
Proposal Number
2007B1738
Beamline
BL13XU
Project Leader
榊 篤史
Proposal Number
2008A1679
Beamline
BL13XU
Project Leader
榊 篤史
Proposal Number
2008B1795
Beamline
BL13XU
Project Leader
榊 篤史
Proposal Number
2013A5080
Beamline
BL16XU
Project Leader
榊 篤史
Proposal Number
2013B5080
Beamline
BL16XU
Project Leader
榊 篤史