Title/Place of Publication
34505
2017.09.15 20:34
10.1380/jsssj.38.378
Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers
Refereed Journals, Doctoral Thesis, Refereed Proceedings
表面科学 (Journal of the Surface Science Society of Japan)
38 8 2017 378-383
[A40] Chemical Science
[M40] X-ray/Soft X-ray Absorption Spectroscopy
Authors
 
First Author 0033107 Wakisaka Yuki Hokkaido University
Coauthor 1 Iwasaki Yuya Hokkaido University
Coauthor 2 0025177 Uehara Hiromitsu Hokkaido University
Coauthor 3 0039630 Mukai Shingo Hokkaido University
Coauthor 4 0038236 Kido Daiki Hokkaido University
Coauthor 5 0009141 Takakusagi Satoru Hokkaido University
Coauthor 6 0015862 Uemura Yohei National Institutes of Natural Sciences
Coauthor 7 0032551 Wada Takahiro Tokyo Medical and Dental University
Coauthor 8 0039569 Yuan Qiuyi Hokkaido University
Coauthor 9 0024411 Sekizawa Oki University of Electro-Communications
Coauthor 10 0000182 Uruga Tomoya University of Electro-Communications, SPring-8/JASRI
Coauthor 11 0006070 Iwasawa Yasuhiro University of Electro-Communications
Coauthor 12 0005040 Asakura Kiyotaka Hokkaido University
Related Proposal Information
2014A7830 BL36XU 朝倉 清高
2016B7902 BL36XU 朝倉 清高
2016A7902 BL36XU 朝倉 清高
2015A7830 BL36XU 朝倉 清高
2014B7830 BL36XU 朝倉 清高