Title/Place of Publication
34354
2017.08.21 09:05
10.1016/j.microrel.2017.07.096
Effects of Thermal Aging on Cu Nanoparticle/Bi-Sn Solder Hybrid Bonding
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Microelectronics Reliability
78 2017 93-99
[A80] Industrial Applications
[M60] X-ray Imaging
Authors
 
First Author 0029103 Usui Masanori Toyota Central Research and Development Laboratories, Inc.
Coauthor 1 Satoh Toshikazu Toyota Central Research and Development Laboratories, Inc.
Coauthor 2 0007350 Kimura Hidehiko Toyota Central Research and Development Laboratories, Inc.
Coauthor 3 Tajima Satomi Toyota Central Research and Development Laboratories, Inc.
Coauthor 4 0007519 Hayashi Yujiro Toyota Central Research and Development Laboratories, Inc.
Coauthor 5 0024524 Setoyama Daigo Toyota Central Research and Development Laboratories, Inc.
Coauthor 6 Kato Masashi Nagoya Institute of Technology
Related Proposal Information
2016A7012 BL33XU 木村 英彦
2016B7012 BL33XU 木村 英彦