User Information

Title/Place of Publication
Publication ID	33989
Date Created	2017.06.29 13:06
DOI	10.1109/CSICS.2016.7751073
Open Access URL
English Title	Time-Resolved Micro-Beam X-Ray Absorption Fine Structure (XAFS) Measurement to Investigate the Cause of a Current Collapse of GaN-HEMTs
Type of Publication	Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)	Journal Title 2016 IEEE Compound Semiconductor Integrated Circuit Symposium Vol. No. Year of Publication 2016 Page 7751073
Place of Publication (Oral, Poster)	Conference Title IEEE Compound Semiconductor Integrated Circuit Symposium Date 2016.10.23-10.26 Venue Austin, USA
Research Area	[A80] Industrial Applications
Research Method	[M40] X-ray/Soft X-ray Absorption Spectroscopy

Authors
	User Card ID No.	Last/Family	First/Given	Affiliation
First Author	0026587	Tateno	Yasunori	Sumitomo Electric Industries, Ltd.
Coauthor 1	0027489	Kouchi	Tsuyoshi	Sumitomo Electric Industries, Ltd.
Coauthor 2	0027505	Komatai	Tsutomu	Sumitomo Electric Device Innovations, Inc.
Coauthor 3		Yamamoto	Hiroshi	Sumitomo Electric Device Innovations, Inc.
Coauthor 4	0029241	Yonemura	Takumi	Sumitomo Electric Industries, Ltd.
Coauthor 5	0003239	Iihara	Junji	Sumitomo Electric Industries, Ltd.
Coauthor 6	0005588	Saito	Yoshihiro	Sumitomo Electric Industries, Ltd.
Coauthor 7		Nakabayashi	Takashi	Sumitomo Electric Industries, Ltd.

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