Title/Place of Publication
3339
2007.01.30 10:56
10.1016/S0168-583X(02)01406-4
Measurement of Minute Local Strain in Semiconductor Materials and Electronic Devices by Using a Highly Parallel X-Ray Microbeam
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Nuclear Instruments and Methods in Physics Research Section B
199 2003 15-18
International Conference on Synchrotron Radiation in Materials Science (SRMS)
2002.01.21-01.24 Shangri-La Hotel, Singapore
Authors
 
First Author 0001232 Matsui Junji Himeji Institute of Technology
Coauthor 1 0001231 Tsusaka Yoshiyuki Himeji Institute of Technology
Coauthor 2 0001341 Yokoyama Kazushi Himeji Institute of Technology
Coauthor 3 0003437 Takeda Shingo Himeji Institute of Technology
Coauthor 4 0005962 Katou Madomi Himeji Institute of Technology
Coauthor 5 0005961 Kurihara Hideaki Himeji Institute of Technology
Coauthor 6 0005966 Watanabe Kyoko Himeji Institute of Technology
Coauthor 7 0001230 Kagoshima Yasushi Himeji Institute of Technology
Coauthor 8 0004124 Kimura Shigeru Himeji Institute of Technology
Related Proposal Information
C01B5041 BL24XU 松井 純爾
C01B5042 BL24XU 篭島 靖
C01B5043 BL24XU 津坂 佳幸
C99B0541 BL24XU 松井 純爾
C99B0545 BL24XU 木村 滋