User Information

Title/Place of Publication
Publication ID	31986
Date Created	2016.09.01 17:36
DOI	10.1016/j.microrel.2016.06.011
Open Access URL
English Title	Degradation of a Sintered Cu Nanoparticle Layer Studied by Synchrotron Radiation Computed Laminography
Type of Publication	Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)	Journal Title Microelectronics Reliability Vol. 63 No. Year of Publication 2016 Page 152-158
Place of Publication (Oral, Poster)	Conference Title Date Venue
Research Area	[A80] Industrial Applications
Research Method	[M60] X-ray Imaging

Authors
	User Card ID No.	Last/Family	First/Given	Affiliation
First Author	0029103	Usui	Masanori	Toyota Central Research and Development Laboratories, Inc., Nagoya Institute of Technology
Coauthor 1	0007350	Kimura	Hidehiko	Toyota Central Research and Development Laboratories, Inc.
Coauthor 2		Satoh	Toshikazu	Toyota Central Research and Development Laboratories, Inc.
Coauthor 3	0029102	Asada	Takashi	Toyota Central Research and Development Laboratories, Inc.
Coauthor 4	0006044	Yamaguchi	Satoshi	Toyota Central Research and Development Laboratories, Inc.
Coauthor 5		Kato	Masashi	Nagoya Institute of Technology

Related Proposal Information
Proposal Number 2015A7012 Beamline BL33XU Project Leader 木村英彦
Proposal Number 2015B7012 Beamline BL33XU Project Leader 木村英彦