Title/Place of Publication
31154
2016.04.26 16:41
10.4028/www.scientific.net/MSF.778-780.59
Dislocation Analysis of 4H-SiC Crystals Obtained at Fast Growth Rate by the High-Temperature Gas Source Method
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Materials Science Forum
778-780 2014 59-62
[A80] Industrial Applications
[M60] X-ray Imaging
Authors
 
First Author 0009160 Kamata Isaho Central Research Institute of Electric Power Industry
Coauthor 1 Hoshino Norihiro Central Research Institute of Electric Power Industry
Coauthor 2 0039591 Tokuda Yuichiro R&D Partnership for Future Power Electronics Technology, Denso Corporation
Coauthor 3 Makino Emi R&D Partnership for Future Power Electronics Technology, Denso Corporation
Coauthor 4 Kojima Jun R&D Partnership for Future Power Electronics Technology, Denso Corporation
Coauthor 5 0013411 Tsuchida Hidekazu Central Research Institute of Electric Power Industry
Coauthor 6
Related Proposal Information
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