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2016.04.26 15:56 |
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Conversion of Basal Plane Dislocations to Threading Edge Dislocations by Annealing 4H-SiC Epilayers at High Temperatures |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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Materials Science Forum
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2013
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[A80] Industrial Applications |
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[M60] X-ray Imaging
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