Title/Place of Publication
31151
2016.04.26 15:56
10.4028/www.scientific.net/MSF.740-742.601
Conversion of Basal Plane Dislocations to Threading Edge Dislocations by Annealing 4H-SiC Epilayers at High Temperatures
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Materials Science Forum
740-742 2013 601-604
[A80] Industrial Applications
[M60] X-ray Imaging
Authors
 
First Author 0025510 Zhang Xuan Central Research Institute of Electric Power Industry
Coauthor 1 0018129 Nagano Masahiro Central Research Institute of Electric Power Industry
Coauthor 2 0013411 Tsuchida Hidekazu Central Research Institute of Electric Power Industry
Related Proposal Information
2011B3321 BL08B2 土田 秀一
2012A3321 BL08B2 土田 秀一
2012B3321 BL08B2 土田 秀一