Title/Place of Publication
30388
2016.01.19 11:36
10.1088/0268-1242/31/3/034002
Formation of Helical Dislocations in Ammonothermal GaN Substrate by Heat Treatment
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Semiconductor Science and Technology
31 3 2016 034002
[A80] Industrial Applications
[M60] X-ray Imaging
Authors
 
First Author Horibuchi Kayo Toyota Central Research and Development Laboratories, Inc.
Coauthor 1 0006044 Yamaguchi Satoshi Toyota Central Research and Development Laboratories, Inc.
Coauthor 2 0021962 Kimoto Yasuji Toyota Central Research and Development Laboratories, Inc.
Coauthor 3 0022372 Nishikawa Koichi Toyota Central Research and Development Laboratories, Inc.
Coauthor 4 Kachi Tetsu Toyota Central Research and Development Laboratories, Inc.
Related Proposal Information
2011B5370 BL16B2 山口 聡
2012A5370 BL16B2 山口 聡
2012B5370 BL16B2 山口 聡
2013A5370 BL16B2 山口 聡