Title/Place of Publication
29655
2015.09.25 18:39
10.4028/www.scientific.net/MSF.778-780.366
Characterization of Threading Edge Dislocation in 4H-SiC by X-ray Topography and Transmission Electron Microscopy
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Materials Science Forum
778-780 2014 366-369
[A80] Industrial Applications
[M60] X-ray Imaging
Authors
 
First Author Sugawara Yoshihiro Japan Fine Ceramics Center
Coauthor 1 Yao Yong-Zhao Japan Fine Ceramics Center
Coauthor 2 Ishikawa Yukari Japan Fine Ceramics Center
Coauthor 3 0032113 Danno Katsunori Toyota Motor Corporation
Coauthor 4 Suzuki Hiroshi Toyota Motor Corporation
Coauthor 5 Bessho Takeshi Toyota Motor Corporation
Coauthor 6 0006044 Yamaguchi Satoshi Toyota Central Research and Development Laboratories, Inc.
Coauthor 7 0022372 Nishikawa Koichi Toyota Central Research and Development Laboratories, Inc.
Coauthor 8 Ikuhara Yuichi Japan Fine Ceramics Center
Related Proposal Information
2009B3322 BL08B2 山口 聡