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29655 |
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2015.09.25 18:39 |
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10.4028/www.scientific.net/MSF.778-780.366 |
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Characterization of Threading Edge Dislocation in 4H-SiC by X-ray Topography and Transmission Electron Microscopy |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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Materials Science Forum
778-780
2014
366-369
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[A80] Industrial Applications |
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[M60] X-ray Imaging
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