|
29650 |
|
2015.09.25 16:17 |
|
|
|
http://amtc5.com/imges/file/vol4/amtc_4_085.pdf |
|
Characterization of Dissociated Threading Edge Dislocation Formed in 4H-SiC by Transmission Electron Microscopy |
|
Refereed Journals, Doctoral Thesis, Refereed Proceedings |
|
AMTC Letters
4
2014
178-179
|
|
The 4th International Symposium on Advanced Microscopy and Theoretical Calculations (AMTC4)
2014.05.08-05.10
Hamamatsu, Japan
|
|
[A80] Industrial Applications |
|
[M60] X-ray Imaging
|