Title/Place of Publication
28147
2015.01.22 09:07
10.7567/JJAP.54.025503
Evaluation of a-type Screw Dislocations in m-GaN Film by Means of X-ray Diffractometry
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Japanese Journal of Applied Physics
54 2 2015 025503
[A30] Materials Science and Engineering
[M10] X-ray Diffraction
Authors
 
First Author 0029236 Hiraiwa Miori Panasonic Corporation, University of Hyogo
Coauthor 1 0031417 Liu Fei Panasonic Corporation
Coauthor 2 0030324 Shibata Satoshi Panasonic Corporation
Coauthor 3 0003437 Takeda Shingo SPring-8/ Service Corporation
Coauthor 4 0001231 Tsusaka Yoshiyuki University of Hyogo
Coauthor 5 0001230 Kagoshima Yasushi University of Hyogo
Coauthor 6 0001232 Matsui Junji University of Hyogo
Related Proposal Information
2012A3258 BL24XU 平岩 美央里
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