Title/Place of Publication
Publication ID
24494
Date Created
2013.07.17 11:37
DOI
10.1063/1.4812496
Open Access URL
English Title
X-ray Microbeam Three-Dimensional Topography for Dislocation Strain-Field Analysis of 4H-SiC
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Journal of Applied Physics
Vol.
114
No.
2
Year of Publication
2013
Page
023511
Place of Publication (Oral, Poster)
Conference Title
Date
Venue
Research Area
[A30] Materials Science and Engineering
Research Method
[M10] X-ray Diffraction
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0006449
Tanuma
Ryohei
Central Research Institute of Electric Power Industry
Coauthor 1
0022672
Mori
Daisuke
Fuji Electric Co., Ltd.
Coauthor 2
0009160
Kamata
Isaho
Central Research Institute of Electric Power Industry
Coauthor 3
0013411
Tsuchida
Hidekazu
Central Research Institute of Electric Power Industry
Related Proposal Information
Proposal Number
2011A3237
Beamline
BL24XU
Project Leader
土田 秀一
Proposal Number
2011B3237
Beamline
BL24XU
Project Leader
土田 秀一
Proposal Number
2012A3237
Beamline
BL24XU
Project Leader
土田 秀一
Proposal Number
2012B3237
Beamline
BL24XU
Project Leader
土田 秀一
Proposal Number
2012A3321
Beamline
BL08B2
Project Leader
土田 秀一
Proposal Number
2012B3321
Beamline
BL08B2
Project Leader
土田 秀一