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23754 |
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2013.05.30 11:28 |
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10.1107/S0909049512048789 |
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An X-ray Raman Spectrometer for EXAFS Studies on Minerals: Bent Laue Spectrometer with 20 kev X-rays |
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Refereed Journals, Doctoral Thesis, Refereed Proceedings |
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Journal of Synchrotron Radiation
20
2
2013
266-271
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[A30] Materials Science and Engineering |
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[M30] Inelastic Scattering
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