Title/Place of Publication
Publication ID
2364
Date Created
2007.01.30 10:55
DOI
10.1016/S0168-583X(02)01585-9
Open Access URL
English Title
Double Resonance Capacitance Spectroscopy (DORCAS): A New Experimental Technique for Assignment of X-Ray Absorption Peaks to Surface Sites of Semiconductor
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Nuclear Instruments and Methods in Physics Research Section B
Vol.
199
No.
Year of Publication
2003
Page
205-210
Place of Publication (Oral, Poster)
Conference Title
International Conference on Synchrotron Radiation in Materials Science (SRMS)
Date
2002.01.21-01.24
Venue
Shangri-La Hotel, Singapore
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001178
Ishii
Masashi
JASRI, RIKEN
Related Proposal Information
Proposal Number
2002A0166
Beamline
BL10XU
Project Leader
石井 真史
Proposal Number
2001B0503
Beamline
BL10XU
Project Leader
石井 真史