Title/Place of Publication
Publication ID
2362
Date Created
2007.01.30 10:55
DOI
10.1143/JJAP.41.4415
Open Access URL
English Title
X-Ray Absorption Fine Structure Measurement Using a Scanning Capacitance Microscope: Trial for Selective Observation of Trap Centers in the ∼nm Region
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Japanese Journal of Applied Physics
Vol.
41
No.
6B
Year of Publication
2002
Page
4415-4418
Place of Publication (Oral, Poster)
Conference Title
2001 International Microprocesses and Nanotechnology Conference (MNC2001)
Date
2001.10.31-11.02
Venue
Matsue, Japan
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001178
Ishii
Masashi
JASRI
Related Proposal Information
Proposal Number
2001B0503
Beamline
BL10XU
Project Leader
石井 真史
Proposal Number
2002A0166
Beamline
BL10XU
Project Leader
石井 真史