|
23586 |
|
2013.04.26 11:27 |
|
10.1016/j.mssp.2012.04.010 |
|
|
|
Direct Observation of Local Atomic Structure in Arsenic Implanted Silicon |
|
Refereed Journals, Doctoral Thesis, Refereed Proceedings |
|
Materials Science in Semiconductor Processing
15
6
2012
707-712
|
|
|
|
[A30] Materials Science and Engineering |
|
[M40] X-ray/Soft X-ray Absorption Spectroscopy
|