Title/Place of Publication
2112
2007.01.30 10:55
10.4028/www.scientific.net/MSF.389-393.87
Growth and Evaluation of High Quality SiC Crystal by Sublimation Method
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Materials Science Forum
389-393 2002 87-90
Authors
 
First Author 0005411 Oyanagi Naoki R&D Association for Future Electron Devices (FED), Ultra-Low-Loss Power Device Technology Research Body (UPR)
Coauthor 1 0003240 Yamaguchi Hirotaka National Institute of Advanced Industrial Science and Technology (AIST), Ultra-Low-Loss Power Device Technology Research Body (UPR)
Coauthor 2 0005408 Kato Tomohisa National Institute of Advanced Industrial Science and Technology (AIST), Ultra-Low-Loss Power Device Technology Research Body (UPR)
Coauthor 3 Nishizawa Shin-ichi National Institute of Advanced Industrial Science and Technology (AIST), Ultra-Low-Loss Power Device Technology Research Body (UPR)
Coauthor 4 0004600 Arai Kazuo National Institute of Advanced Industrial Science and Technology (AIST), Ultra-Low-Loss Power Device Technology Research Body (UPR)
Related Proposal Information
2000B0314 BL28B2 山口 博隆
2001A0122 BL28B2 山口 博隆