Title/Place of Publication
19096
2011.06.30 02:28
10.1149/1.3481635
Study of HfO2/Si/Strained-Ge/SiGe Using Angle Resolved X-ray Photoelectron Spectroscopy
Refereed Journals, Doctoral Thesis, Refereed Proceedings
ECS Transactions
33 3 2010 467-472
Authors
 
First Author 0027293 Komatsu Arata Tokyo City University
Coauthor 1 Nasu Kentarou Tokyo City University
Coauthor 2 Hoshi Yusuke Tokyo City University
Coauthor 3 Kurebayashi Toru Tokyo City University
Coauthor 4 Sawano Kentarou Tokyo City University
Coauthor 5 Myronov Maksym The University of Warwick
Coauthor 6 0008035 Nohira Hiroshi Tokyo City University
Coauthor 7 Shiraki Yasuhiro Tokyo City University
Related Proposal Information
2009B0026 BL46XU 宮崎 誠一
2010A0026 BL46XU 宮崎 誠一
2009A1754 BL47XU 野平 博司