Title/Place of Publication
Publication ID
1864
Date Created
2007.01.30 10:55
DOI
10.1016/S0921-4526(01)00927-9
Open Access URL
English Title
Capacitance X-Ray Absorption Fine Structure Measurement Using Scanning Probe A New Method for Local Structure Analysis of Surface Defects
Type of Publication
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Place of Publication (Journal)
Journal Title
Physica B
Vol.
308-310
No.
Year of Publication
2001
Page
1153-1156
Place of Publication (Oral, Poster)
Conference Title
The 21st International Conference on Defects in Semiconductors
Date
2001.07.16-07.20
Venue
Giessen, Germany
Research Area
Research Method
Authors
User Card ID No.
Last/Family
First/Given
Affiliation
Corresponding
Author
First Author
0001178
Ishii
Masashi
JASRI
Related Proposal Information
Proposal Number
2000B0181
Beamline
BL10XU
Project Leader
石井 真史
Proposal Number
2001B0503
Beamline
BL10XU
Project Leader
石井 真史
Proposal Number
1999B0168
Beamline
BL10XU
Project Leader
石井 真史