Title/Place of Publication
2010.09.21 19:21
Time-Resolved X-ray Diffraction Measurements of High-Density InAs Quantum Dots on Sb/GaAs Layers and the Suppression of Coalescence by Sb-Irradiated Growth Interruption
Refereed Journals, Doctoral Thesis, Refereed Proceedings
Japanese Journal of Applied Physics
49 9 2010 095602
First Author 0021029 Kakuda Naoki The University of Electro-Communications
Coauthor 1 0002841 Kaizu Toshiyuki National Institute for Materials Science
Coauthor 2 0001168 Takahashi Masamitsu JAEA
Coauthor 3 0004806 Fujikawa Seiji JAEA
Coauthor 4 0015224 Yamaguchi Kouichi The University of Electro-Communications
Related Proposal Information
2009A3571 BL11XU 山口 浩一
2008B3572 BL11XU 山口 浩一
2008A3572 BL11XU 山口 浩一